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This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License
Article
Voltage-Based Hot-Spot Detection Method for Defective Cell in Photovoltaic Module Using Projector
Author(s)
Yadong Wang1, Kazutaka Itako1, Tsugutomo Kudoh1, Keishin Koh1 and Qiang Ge2
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DOI:10.17265/1934-8975/2016.08.005
Affiliation(s)
1. Department of Electrical and Electronic Engineering, Kanagawa Institute of Technology, Kanagawa 243-0292, Japan
2. Department of Energy and Power Engineering, Yangzhou University, Yangzhou 225127, China
ABSTRACT
This paper proposes a
voltage-based hot-spot detection method for defective cells in PV module using
projector. The presence of internal crystal defects is one of the main causes
of hot-spot phenomenon in PV modules. Authors previously investigated the
physical characteristics of hot-spot phenomenon referring to internal crystal
defect. Based on it, a hot-spot detection method named as current-based SRC (self
reverse current) detection method is developed. However, it becomes
extraordinarily complicated to determine the defective cells under low
illumination. In order to avoid this disadvantage, authors improve the SRC
detection method by applying voltage. From the feasibility experiment results,
it is confirmed that by calculating cell HSI (hotspots index) with voltage, the
PV modules with defective cells can be prospectively excluded even under low
illumination.
KEYWORDS
Hot-spot, PV module, crystal defect, detection method, hot spot index.
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