Open    Access



Development of Contactless Method of the DUT Heating during Single-Event Effect Tests



Author(s)

Vasily S. Anashin, Eugeny V. Mitin, Aleksandr E. Koziukov and Ekaterina N. Nekrasova

Full-Text PDF XML     743 Views

DOI:10.17265/2159-5348/2018.02.004

Branch of Joint-Stock Company United Rocket and Space Corporation–Institute Of Space Device Engineering, Moscow 111250, Russia

This paper presents two approaches to perform the electronic device heating during radiation hardness assurance tests. Commonly used conductive heating approach is compared with contactless laser-based approach, characteristics and limitations of these methods are described. Experimental results for temperature dependence of single-event latchup (SEL) cross-section during heavy ion irradiation along with some aspects of physics-based numerical simulation of heat transfer processes are presented.

Single-event effect (SEE) tests, heavy ions, radiation hardness, heating methods, SEL.